Filtrar :
| Norma o proyecto bajo la responsabilidad directa de 香港六合彩开奖/TC 201/SC 7 Secretar铆a | Etapa | ICS |
|---|---|---|
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Surface chemical analysis 鈥� X-ray photoelectron spectroscopy 鈥� Method of intensity calibration for quartz-crystal monochromated Al K伪 XPS instruments
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60.60 | |
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Surface chemical analysis 鈥� X-ray photoelectron spectroscopy 鈥� Guidelines for analysis
|
95.99 | |
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Surface chemical analysis 鈥� X-ray photoelectron spectroscopy 鈥� Guidelines for analysis
|
90.20 | |
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Surface chemical analysis 鈥� X-ray photoelectron spectroscopy 鈥� Reporting of results of thin-film analysis
|
90.93 | |
|
Surface chemical analysis 鈥� Characterization of nanostructured materials
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95.99 | |
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Surface chemical analysis 鈥� Characterization of nanostructured materials
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60.60 | |
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Surface chemical analysis 鈥� X-ray photoelectron spectroscopy 鈥� Measurement of silicon oxide thickness
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95.99 | |
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Surface chemical analysis 鈥� X-ray photoelectron spectroscopy 鈥� Measurement of silicon oxide thickness
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90.60 | |
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Surface chemical analysis 鈥� X-ray photoelectron spectroscopy 鈥� Description of selected instrumental performance parameters
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95.99 | |
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Surface chemical analysis 鈥� X-ray photoelectron spectroscopy 鈥� Description of selected instrumental performance parameters
|
90.93 | |
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Surface chemical analysis 鈥� Auger electron spectroscopy 鈥� Description of selected instrumental performance parameters
|
95.99 | |
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Surface chemical analysis 鈥� Auger electron spectroscopy 鈥� Description of selected instrumental performance parameters
|
90.93 | |
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Surface chemical analysis 鈥� X-ray photoelectron spectrometers 鈥� Calibration of energy scales
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95.99 | |
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Surface chemical analysis 鈥� X-ray photoelectron spectrometers 鈥� Calibration of energy scales
|
90.93 | |
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Surface chemical analysis 鈥� X-ray photoelectron spectroscopy 鈥� Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
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95.99 | |
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Surface chemical analysis 鈥� X-ray photoelectron spectroscopy 鈥� Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
|
90.60 | |
|
Surface chemical analysis 鈥� Medium-resolution Auger electron spectrometers 鈥� Calibration of energy scales for elemental analysis
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95.99 | |
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Surface chemical analysis 鈥� Medium-resolution Auger electron spectrometers 鈥� Calibration of energy scales for elemental analysis
|
95.99 | |
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Surface chemical analysis 鈥� Medium-resolution Auger electron spectrometers 鈥� Calibration of energy scales for elemental analysis
|
60.60 | |
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Surface chemical analysis 鈥� High-resolution Auger electron spectrometers 鈥� Calibration of energy scales for elemental and chemical-state analysis
|
90.93 | |
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Surface chemical analysis 鈥� Auger electron spectroscopy and X-ray photoelectron spectroscopy 鈥� Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
|
95.99 | |
|
Surface chemical analysis 鈥� Auger electron spectroscopy and X-ray photoelectron spectroscopy 鈥� Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
|
95.99 | |
|
Surface chemical analysis 鈥� Auger electron spectroscopy and X-ray photoelectron spectroscopy 鈥� Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
|
60.60 | |
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Surface chemical analysis 鈥� X-ray photoelectron spectroscopy 鈥� Procedures for determining backgrounds
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90.92 | |
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Surface chemical analysis 鈥� X-ray photoelectron spectroscopy 鈥� Procedures for determining backgrounds
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30.99 | |
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Surface chemical analysis 鈥� Auger electron spectroscopy 鈥� Derivation of chemical information
|
95.99 | |
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Surface chemical analysis 鈥� Auger electron spectroscopy 鈥� Derivation of chemical information
|
60.60 | |
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Surface chemical analysis 鈥� Electron spectroscopies 鈥� Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
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90.93 | |
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Surface chemical analysis 鈥� X-ray photoelectron spectroscopy 鈥� Reporting of methods used for charge control and charge correction
|
95.99 | |
|
Surface chemical analysis 鈥� X-ray photoelectron spectroscopy 鈥� Reporting of methods used for charge control and charge correction
|
60.60 | |
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Surface chemical analysis 鈥� X-ray photoelectron spectroscopy 鈥� Estimating and reporting detection limits for elements in homogeneous materials
|
90.60 | |
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Surface chemical analysis 鈥� Electron spectroscopies 鈥� Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
|
90.93 | |
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Surface chemical analysis 鈥� Auger electron spectroscopy and X-ray photoelectron spectroscopy 鈥� Methods used to determine peak intensities and information required when reporting results
|
95.99 | |
|
Surface chemical analysis 鈥� Auger electron spectroscopy and X-ray photoelectron spectroscopy 鈥� Methods used to determine peak intensities and information required when reporting results
|
95.99 | |
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Surface chemical analysis 鈥� Auger electron spectroscopy and X-ray photoelectron spectroscopy 鈥� Methods used to determine peak intensities and information required when reporting results
|
90.60 | |
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Surface chemical analysis 鈥� X-ray photoelectron and Auger electron spectrometers 鈥� Linearity of intensity scale
|
90.93 | |
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Surface chemical analysis 鈥� Electron spectroscopies 鈥� Measurement of the thickness and composition of nanoparticle coatings
|
60.60 | |
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Surface chemical analysis 鈥� Auger electron spectroscopy 鈥� Repeatability and constancy of intensity scale
|
90.93 | |
|
Surface chemical analysis 鈥� X-ray photoelectron spectroscopy 鈥� Repeatability and constancy of intensity scale
|
90.92 | |
|
Surface chemical analysis 鈥� X-ray photoelectron spectroscopy 鈥� Repeatability and constancy of intensity scale
|
30.60 | |
|
Surface chemical analysis 鈥� Auger electron spectroscopy 鈥� Reporting of methods used for charge control and charge correction
|
90.93 |
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