<![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½±/TC 201/SC 7 - Electron spectroscopies]]> /cms/render/live/es/sites/isoorg/contents/data/committee/05/46/54662.html Normas y proyectos de Ïã¸ÛÁùºÏ²Ê¿ª½± Ïã¸ÛÁùºÏ²Ê¿ª½±.org 60 /modules/isoorg-template/img/iso/favicon/red/favicon1.ico http://www.iso.org/ <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½±/TC 201/SC 7 - Electron spectroscopies]]> <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 10810:2019 - Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis]]> /cms/render/live/es/sites/isoorg/contents/data/standard/07/42/74286.html /cms/render/live/es/sites/isoorg/contents/data/standard/07/42/74286.html 2024-07-15 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 17973:2016 - Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis]]> /cms/render/live/es/sites/isoorg/contents/data/standard/07/10/71084.html /cms/render/live/es/sites/isoorg/contents/data/standard/07/10/71084.html 2024-07-03 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 17973:2024 - Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis]]> /cms/render/live/es/sites/isoorg/contents/data/standard/08/64/86468.html /cms/render/live/es/sites/isoorg/contents/data/standard/08/64/86468.html 2024-07-03 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 5861:2024 - Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments]]> /cms/render/live/es/sites/isoorg/contents/data/standard/08/17/81741.html /cms/render/live/es/sites/isoorg/contents/data/standard/08/17/81741.html 2024-06-07 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 20903:2019 - Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results]]> /cms/render/live/es/sites/isoorg/contents/data/standard/07/48/74817.html /cms/render/live/es/sites/isoorg/contents/data/standard/07/48/74817.html 2024-06-04 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 16129:2018 - Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer]]> /cms/render/live/es/sites/isoorg/contents/data/standard/07/48/74819.html /cms/render/live/es/sites/isoorg/contents/data/standard/07/48/74819.html 2024-03-04 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 14701:2018 - Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness]]> /cms/render/live/es/sites/isoorg/contents/data/standard/07/48/74818.html /cms/render/live/es/sites/isoorg/contents/data/standard/07/48/74818.html 2024-03-04 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 18118:2015 - Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials]]> /cms/render/live/es/sites/isoorg/contents/data/standard/06/73/67328.html /cms/render/live/es/sites/isoorg/contents/data/standard/06/73/67328.html 2024-02-28 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 18118:2024 - Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials]]> /cms/render/live/es/sites/isoorg/contents/data/standard/08/17/81742.html /cms/render/live/es/sites/isoorg/contents/data/standard/08/17/81742.html 2024-02-28 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½±/CD 24237 - Surface chemical analysis — X-ray photoelectron spectroscopy — Repeatability and constancy of intensity scale]]> /cms/render/live/es/sites/isoorg/contents/data/standard/08/64/86471.html /cms/render/live/es/sites/isoorg/contents/data/standard/08/64/86471.html 2024-01-23 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 24237:2005 - Surface chemical analysis — X-ray photoelectron spectroscopy — Repeatability and constancy of intensity scale]]> /cms/render/live/es/sites/isoorg/contents/data/standard/03/71/37116.html /cms/render/live/es/sites/isoorg/contents/data/standard/03/71/37116.html 2023-01-30 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 19668:2017 - Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials]]> /cms/render/live/es/sites/isoorg/contents/data/standard/06/59/65947.html /cms/render/live/es/sites/isoorg/contents/data/standard/06/59/65947.html 2022-12-03 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½±/CD TR 18392 - Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds]]> /cms/render/live/es/sites/isoorg/contents/data/standard/07/48/74822.html /cms/render/live/es/sites/isoorg/contents/data/standard/07/48/74822.html 2022-09-05 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 15470:2017 - Surface chemical analysis — X-ray photoelectron spectroscopy — Description of selected instrumental performance parameters]]> /cms/render/live/es/sites/isoorg/contents/data/standard/07/19/71922.html /cms/render/live/es/sites/isoorg/contents/data/standard/07/19/71922.html 2022-07-16 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 15471:2016 - Surface chemical analysis — Auger electron spectroscopy — Description of selected instrumental performance parameters]]> /cms/render/live/es/sites/isoorg/contents/data/standard/07/10/71085.html /cms/render/live/es/sites/isoorg/contents/data/standard/07/10/71085.html 2021-12-10 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½±/TR 23173:2021 - Surface chemical analysis — Electron spectroscopies — Measurement of the thickness and composition of nanoparticle coatings]]> /cms/render/live/es/sites/isoorg/contents/data/standard/07/48/74821.html /cms/render/live/es/sites/isoorg/contents/data/standard/07/48/74821.html 2021-06-25 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 13424:2013 - Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis]]> /cms/render/live/es/sites/isoorg/contents/data/standard/05/37/53773.html /cms/render/live/es/sites/isoorg/contents/data/standard/05/37/53773.html 2021-06-17 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 18554:2016 - Surface chemical analysis — Electron spectroscopies — Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy]]> /cms/render/live/es/sites/isoorg/contents/data/standard/06/28/62874.html /cms/render/live/es/sites/isoorg/contents/data/standard/06/28/62874.html 2021-06-17 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 17974:2002 - Surface chemical analysis — High-resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical-state analysis]]> /cms/render/live/es/sites/isoorg/contents/data/standard/03/16/31659.html /cms/render/live/es/sites/isoorg/contents/data/standard/03/16/31659.html 2021-06-17 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 21270:2004 - Surface chemical analysis — X-ray photoelectron and Auger electron spectrometers — Linearity of intensity scale]]> /cms/render/live/es/sites/isoorg/contents/data/standard/03/58/35830.html /cms/render/live/es/sites/isoorg/contents/data/standard/03/58/35830.html 2021-06-17 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 24236:2005 - Surface chemical analysis — Auger electron spectroscopy — Repeatability and constancy of intensity scale]]> /cms/render/live/es/sites/isoorg/contents/data/standard/03/71/37115.html /cms/render/live/es/sites/isoorg/contents/data/standard/03/71/37115.html 2021-06-17 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 19318:2021 - Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of methods used for charge control and charge correction]]> /cms/render/live/es/sites/isoorg/contents/data/standard/08/14/81448.html /cms/render/live/es/sites/isoorg/contents/data/standard/08/14/81448.html 2021-06-04 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 19318:2004 - Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of methods used for charge control and charge correction]]> /cms/render/live/es/sites/isoorg/contents/data/standard/03/37/33783.html /cms/render/live/es/sites/isoorg/contents/data/standard/03/37/33783.html 2021-06-04 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 19830:2015 - Surface chemical analysis — Electron spectroscopies — Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy]]> /cms/render/live/es/sites/isoorg/contents/data/standard/06/62/66294.html /cms/render/live/es/sites/isoorg/contents/data/standard/06/62/66294.html 2021-05-21 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 29081:2010 - Surface chemical analysis — Auger electron spectroscopy — Reporting of methods used for charge control and charge correction]]> /cms/render/live/es/sites/isoorg/contents/data/standard/04/53/45329.html /cms/render/live/es/sites/isoorg/contents/data/standard/04/53/45329.html 2021-05-21 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 15472:2010 - Surface chemical analysis — X-ray photoelectron spectrometers — Calibration of energy scales]]> /cms/render/live/es/sites/isoorg/contents/data/standard/05/57/55796.html /cms/render/live/es/sites/isoorg/contents/data/standard/05/57/55796.html 2020-12-03 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½±/TR 14187:2011 - Surface chemical analysis — Characterization of nanostructured materials]]> /cms/render/live/es/sites/isoorg/contents/data/standard/05/44/54487.html /cms/render/live/es/sites/isoorg/contents/data/standard/05/44/54487.html 2020-06-30 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½±/TR 14187:2020 - Surface chemical analysis — Characterization of nanostructured materials]]> /cms/render/live/es/sites/isoorg/contents/data/standard/07/48/74820.html /cms/render/live/es/sites/isoorg/contents/data/standard/07/48/74820.html 2020-06-30 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 10810:2010 - Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis]]> /cms/render/live/es/sites/isoorg/contents/data/standard/04/61/46134.html /cms/render/live/es/sites/isoorg/contents/data/standard/04/61/46134.html 2019-08-22 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 20903:2011 - Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results]]> /cms/render/live/es/sites/isoorg/contents/data/standard/05/91/59163.html /cms/render/live/es/sites/isoorg/contents/data/standard/05/91/59163.html 2019-02-13 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 16129:2012 - Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer]]> /cms/render/live/es/sites/isoorg/contents/data/standard/05/57/55727.html /cms/render/live/es/sites/isoorg/contents/data/standard/05/57/55727.html 2018-11-15 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 14701:2011 - Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness]]> /cms/render/live/es/sites/isoorg/contents/data/standard/05/49/54929.html /cms/render/live/es/sites/isoorg/contents/data/standard/05/49/54929.html 2018-10-31 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½±/TR 18392:2005 - Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds]]> /cms/render/live/es/sites/isoorg/contents/data/standard/03/86/38673.html /cms/render/live/es/sites/isoorg/contents/data/standard/03/86/38673.html 2017-09-23 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 15470:2004 - Surface chemical analysis — X-ray photoelectron spectroscopy — Description of selected instrumental performance parameters]]> /cms/render/live/es/sites/isoorg/contents/data/standard/02/71/27191.html /cms/render/live/es/sites/isoorg/contents/data/standard/02/71/27191.html 2017-03-02 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 15471:2004 - Surface chemical analysis — Auger electron spectroscopy — Description of selected instrumental performance parameters]]> /cms/render/live/es/sites/isoorg/contents/data/standard/02/71/27192.html /cms/render/live/es/sites/isoorg/contents/data/standard/02/71/27192.html 2016-09-05 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 17973:2002 - Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis]]> /cms/render/live/es/sites/isoorg/contents/data/standard/03/16/31658.html /cms/render/live/es/sites/isoorg/contents/data/standard/03/16/31658.html 2016-09-05 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½±/TR 18394:2016 - Surface chemical analysis — Auger electron spectroscopy — Derivation of chemical information]]> /cms/render/live/es/sites/isoorg/contents/data/standard/06/48/64895.html /cms/render/live/es/sites/isoorg/contents/data/standard/06/48/64895.html 2016-05-02 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½±/TR 18394:2006 - Surface chemical analysis — Auger electron spectroscopy — Derivation of chemical information]]> /cms/render/live/es/sites/isoorg/contents/data/standard/03/86/38675.html /cms/render/live/es/sites/isoorg/contents/data/standard/03/86/38675.html 2016-05-02 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 18118:2004 - Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials]]> /cms/render/live/es/sites/isoorg/contents/data/standard/02/91/29146.html /cms/render/live/es/sites/isoorg/contents/data/standard/02/91/29146.html 2015-04-08 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 20903:2006 - Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results]]> /cms/render/live/es/sites/isoorg/contents/data/standard/04/11/41181.html /cms/render/live/es/sites/isoorg/contents/data/standard/04/11/41181.html 2011-10-26 <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½± 15472:2001 - Surface chemical analysis — X-ray photoelectron spectrometers — Calibration of energy scales]]> /cms/render/live/es/sites/isoorg/contents/data/standard/02/71/27190.html /cms/render/live/es/sites/isoorg/contents/data/standard/02/71/27190.html 2010-04-19