éܳé
This document is intended to aid the operators of X-ray photoelectron spectrometers in their analysis of typical samples. It takes the operator through the analysis from the handling of the sample and the calibration and setting-up of the spectrometer to the acquisition of wide and narrow scans and also gives advice on quantification and on preparation of the final report.
Informations générales
-
État actuel: ʳܲéDate de publication: 2019-08Stade: Norme internationale en cours d'examen systématique [90.20]
-
Edition: 2
-
dzé technique :ϲʿ/TC 201/SC 7ICS :71.040.40
- RSS mises à jour
Cycle de vie
-
ʰééԳ
ԲԳܱéϲʿ 10810:2010
-
Actuellement
Vous avez une question?
Consulter notre Aide et assistance
Service à la clientèle
+41 22 749 08 88
Horaires d’ouverture:
De lundi à vendredi - 09:00-12:00, 14:00-17:00 (UTC+1)