Reference number
ϲʿ/TS 21383:2021
Technical Specification
ϲʿ/TS 21383:2021
Microbeam analysis — Scanning electron microscopy — Qualification of the scanning electron microscope for quantitative measurements
Edition 1
2021-03
Technical Specification
Preview
ϲʿ/TS 21383:2021
70832
Indisponible en ڰç
ʳܲé (Edition 1, 2021)

ϲʿ/TS 21383:2021

ϲʿ/TS 21383:2021
70832
Langue
Format
CHF 194
Convertir les francs suisses (CHF) dans

éܳé

This document describes methods to qualify the scanning electron microscope with the digital imaging system for quantitative and qualitative SEM measurements by evaluating essential scanning electron microscope performance parameters to maintain the performance after installation of the instruments. The items and evaluating methods of the performance parameters are selected by users for their own purposes.

Informations générales

  •  : ʳܲé
     : 2021-03
    : Clôture de l'examen [90.60]
  •  : 1
  • ϲʿ/TC 202/SC 4
    37.020 
  • RSS mises à jour

Cycle de vie

Vous avez une question?

Consulter notre Aide et assistance

Service à la clientèle
+41 22 749 08 88

Horaires d’ouverture:
De lundi à vendredi - 09:00-12:00, 14:00-17:00 (UTC+1)