Reference number
ϲʿ 19830:2015
International Standard
ϲʿ 19830:2015
Surface chemical analysis — Electron spectroscopies — Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Edition 1
2015-11
Preview
ϲʿ 19830:2015
66294
Indisponible en ڰç
ʳܲé (Edition 1, 2015)
Cette publication a été révisée et confirmée pour la dernière fois en 2021. Cette édition reste donc d’actualité.

ϲʿ 19830:2015

ϲʿ 19830:2015
66294
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ϲʿ 19830:2015 Standard is to define how peak fitting and the results of peak fitting in X-ray photoelectron spectroscopy shall be reported. It is applicable to the fitting of a single spectrum or to a set of related spectra, as might be acquired, for example, during a depth profile measurement. This International Standard provides a list of those parameters which shall be reported if either reproducible peak fitting is to be achieved or a number of spectra are to be fitted and the fitted spectra compared. This International Standard does not provide instructions for peak fitting nor the procedures which should be adopted.

Informations générales

  •  : ʳܲé
     : 2015-11
    : Norme internationale confirmée [90.93]
  •  : 1
  • ϲʿ/TC 201/SC 7
    71.040.40 
  • RSS mises à jour

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