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ϲʿ 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ϲʿ 23833 also included, where appropriate.
ϲʿ 22493:2014is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ϲʿ 22493:2014 are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.
Informations générales
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État actuel: ʳܲéDate de publication: 2014-04Stade: Norme internationale en cours d'examen systématique [90.20]
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Edition: 2
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dzé technique :ϲʿ/TC 202/SC 1
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Cycle de vie
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ԲԳܱéϲʿ 22493:2008
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