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ϲʿ 18114:2003 specifies a method of determining relative sensitivity factors (RSFs) for secondary-ion mass spectrometry (SIMS) from ion-implanted reference materials.
The method is applicable to specimens in which the matrix is of uniform chemical composition, and in which the peak concentration of the implanted species does not exceed one atomic percent.
Informations générales
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État actuel: ԲԳܱéDate de publication: 2003-04Stade: Annulation de la Norme internationale [95.99]
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Edition: 1
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dzé technique :ϲʿ/TC 201/SC 6ICS :71.040.40
- RSS mises à jour
Cycle de vie
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Actuellement
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Révisée par
ʳܲéϲʿ 18114:2021
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