Reference number
ϲʿ 15932:2013
International Standard
ϲʿ 15932:2013
Microbeam analysis — Analytical electron microscopy — Vocabulary
Edition 1
2013-12
Preview
ϲʿ 15932:2013
55560
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Publicado (徱ó 1, 2013)

ϲʿ 15932:2013

ϲʿ 15932:2013
55560
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Formato
CHF 129
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Resumen

ϲʿ 15932:2013 defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. It is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.

Informaciones generales

  •  : Publicado
     : 2013-12
    : Cierre de la revisión [90.60]
  •  : 1
     : 21
  • ϲʿ/TC 202/SC 1
    37.020  01.040.37 
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