Filtrar :
| Norma o proyecto bajo la responsabilidad directa de 香港六合彩开奖/TC 202/SC 3 Secretar铆a | Etapa | ICS |
|---|---|---|
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Microbeam analysis 鈥� Analytical electron microscopy 鈥� The measurement of the dislocation density in thin metals
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20.00 |
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Microbeam analysis 鈥� Analytical electron microscopy 鈥� Guidelines of specimen preparation for transmission electron microscope using focused ion beam processing
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20.20 |
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Microbeam analysis 鈥� Analytical electron microscopy 鈥� Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
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90.92 | |
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Microbeam analysis 鈥� Analytical electron microscopy 鈥� Method of determination for apparent growth direction of wire-like crystals by transmission electron microscopy
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60.00 | |
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Microbeam analysis 鈥� Analytical electron microscopy 鈥� Method for the determination of interface position in the cross-sectional image of the layered materials
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90.92 | |
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Microbeam analysis 鈥� Analytical electron microscopy 鈥� Method for the determination of interface position in the cross-sectional image of the layered materials
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50.20 | |
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Microbeam analysis 鈥� Analytical electron microscopy 鈥� Method for the determination of energy resolution for electron energy loss spectrum analysis
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60.60 | |
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Microbeam analysis 鈥� Analytical electron microscopy 鈥� Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
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60.60 | |
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Microbeam analysis 鈥� Analytical electron microscopy 鈥� Selected-area electron diffraction analysis using a transmission electron microscope
|
95.99 | |
|
Microbeam analysis 鈥� Analytical electron microscopy 鈥� Selected area electron diffraction analysis using a transmission electron microscope
|
90.92 | |
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Microbeam analysis 鈥� Analytical electron microscopy 鈥� Selected area electron diffraction analysis using a transmission electron microscope
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40.60 | |
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Microbeam analysis 鈥� Analytical transmission electron microscopy 鈥� Methods for calibrating image magnification by using reference materials having periodic structures
|
95.99 | |
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Microbeam analysis 鈥� Analytical electron microscopy 鈥� Methods for calibrating image magnification by using reference materials with periodic structures
|
95.99 | |
|
Microbeam analysis 鈥� Analytical electron microscopy 鈥� Methods for calibrating image magnification by using reference materials with periodic structures
|
60.60 |
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