Committee Draft
Ïã¸ÛÁùºÏ²Ê¿ª½±/CD 16666.2
Total reflection X-ray fluorescence — Principles and definitions
Reference number
Ïã¸ÛÁùºÏ²Ê¿ª½±/CD 16666.2
Edition 1
Committee Draft
Ïã¸ÛÁùºÏ²Ê¿ª½±/CD 16666.2
84747
A draft is being reviewed by the committee.

Abstract

This document specifies terms and definitions for analytical methods where elements are identified and their concentrations determined by measuring X ray fluorescence radiation. The aim of this document is to establish terms and definitions for TXRF and to match these with terms and definitions relating to X ray fluorescence analysis.

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