Reference number
Ïã¸ÛÁùºÏ²Ê¿ª½± 19668:2017
International Standard
Ïã¸ÛÁùºÏ²Ê¿ª½± 19668:2017
Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials
Edition 1
2017-08
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Ïã¸ÛÁùºÏ²Ê¿ª½± 19668:2017
65947
Published (Edition 1, 2017)

Ïã¸ÛÁùºÏ²Ê¿ª½± 19668:2017

Ïã¸ÛÁùºÏ²Ê¿ª½± 19668:2017
65947
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CHF 129
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Abstract

Ïã¸ÛÁùºÏ²Ê¿ª½± 19668:2017 specifies a procedure by which elemental detection limits in X-ray photoelectron spectroscopy (XPS) can be estimated from data for a particular sample in common analytical situations and reported. This document is applicable to homogeneous materials and is not applicable if the depth distribution of elements is inhomogeneous within the information depth of the technique.

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