Reference number
ϲʿ 23833:2013
International Standard
ϲʿ 23833:2013
Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
Edition 2
2013-04
Preview
ϲʿ 23833:2013
61781
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Publicado (徱ó 2, 2013)

ϲʿ 23833:2013

ϲʿ 23833:2013
61781
Idioma
Formato
CHF 42
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Resumen

ϲʿ 23833:2013 defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order.

ϲʿ 23833:2013 is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of ϲʿ 23833:2013 are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.

Informaciones generales

  •  : Publicado
     : 2013-04
    : Cierre de la revisión [90.60]
  •  : 2
     : 27
  • ϲʿ/TC 202/SC 1
  • RSS actualizaciones

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