Reference number
ϲʿ 23830:2008
International Standard
ϲʿ 23830:2008
Surface chemical analysis — Secondary-ion mass spectrometry — Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
Edition 1
2008-11
Preview
ϲʿ 23830:2008
41871
No disponible en 貹ñDZ
Publicado (徱ó 1, 2008)
Esta publicación se revisó y confirmó por última vez en 2022. Por lo tanto, esta versión es la actual.

ϲʿ 23830:2008

ϲʿ 23830:2008
41871
Idioma
Formato
CHF 63
Convertir Franco suizo (CHF) a

Resumen

ϲʿ 23830:2008 specifies a method for confirming the repeatability and constancy of the positive-ion relative-intensity scale of static secondary-ion mass spectrometers, for general analytical purposes. It is only applicable to instruments that incorporate an electron gun for charge neutralization. It is not intended to be a calibration of the intensity/mass response function. That calibration may be made by the instrument manufacturer or another organization. The present method provides data to confirm the constancy of relative intensities with instrument usage. Guidance is given on some of the instrument settings that may affect this constancy.

Informaciones generales

  •  : Publicado
     : 2008-11
    : Norma Internacional confirmada [90.93]
  •  : 1
     : 12
  • ϲʿ/TC 201/SC 6
    71.040.40 
  • RSS actualizaciones

Ciclo de vida

¿Tiene alguna duda?

Consulte nuestras Ayuda y asistencia

Atención al cliente
+41 22 749 08 88

Horario de asistencia:
De lunes a viernes - 09:00-12:00, 14:00-17:00 (UTC+1)