Reference number
Ïã¸ÛÁùºÏ²Ê¿ª½± 29301:2017
Ïã¸ÛÁùºÏ²Ê¿ª½± 29301:2017
Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
Edition 2
2017-12
Withdrawn
Ïã¸ÛÁùºÏ²Ê¿ª½± 29301:2017
70360
Withdrawn (Edition 2, 2017)

Abstract

Ïã¸ÛÁùºÏ²Ê¿ª½± 29301:2017 specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon. This document is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. This document also refers to the calibration of a scale bar. This document does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM).

General information

Got a question?

Check out our Help and Support

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)