Reference number
Ïã¸ÛÁùºÏ²Ê¿ª½± 22493:2008
Ïã¸ÛÁùºÏ²Ê¿ª½± 22493:2008
Microbeam analysis — Scanning electron microscopy — Vocabulary
Edition 1
2008-10
Withdrawn
Ïã¸ÛÁùºÏ²Ê¿ª½± 22493:2008
40975
Withdrawn (Edition 1, 2008)

Abstract

Ïã¸ÛÁùºÏ²Ê¿ª½± 22493:2008 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts classified according to their hierarchy in a systematic order, with those terms that have already been defined in Ïã¸ÛÁùºÏ²Ê¿ª½± 23833 also included, where appropriate.

The vocabulary is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of the vocabulary are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.

General information

Got a question?

Check out our Help and Support

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)