<![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½±/WD 16887]]> /cms/render/live/es/sites/isoorg/contents/data/standard/08/48/84838.html Normas y proyectos de Ïã¸ÛÁùºÏ²Ê¿ª½± Ïã¸ÛÁùºÏ²Ê¿ª½±.org 60 /modules/isoorg-template/img/iso/favicon/red/favicon1.ico http://www.iso.org/ <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½±/WD 16887]]> <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½±/WD 16887 - Microbeam analysis — Analytical electron microscopy — Guidelines of specimen preparation for transmission electron microscope using focused ion beam processing]]> /cms/render/live/es/sites/isoorg/contents/data/standard/08/48/84838.html /cms/render/live/es/sites/isoorg/contents/data/standard/08/48/84838.html 2024-05-24