<![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½±/FDIS 20263]]> /cms/render/live/en/sites/isoorg/contents/data/standard/08/76/87682.html Ïã¸ÛÁùºÏ²Ê¿ª½± standards and projects Ïã¸ÛÁùºÏ²Ê¿ª½±.org 60 /modules/isoorg-template/img/iso/favicon/red/favicon1.ico http://www.iso.org/ <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½±/FDIS 20263]]> <![CDATA[Ïã¸ÛÁùºÏ²Ê¿ª½±/FDIS 20263 - Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials]]> /cms/render/live/en/sites/isoorg/contents/data/standard/08/76/87682.html /cms/render/live/en/sites/isoorg/contents/data/standard/08/76/87682.html 2024-08-12